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    The US manufacturer High Quality AFM Probes, SPM Probes, Probe Tips, MFM probes, EFM Probes, Contact Mode Probes, Non-contact Mode Probes, Silicon Probes, ...
    Standards3
    Scanning2
    Microscopes2
    Probe2
    MEMS1
    Profilers1
    atomic force microscope1
    scanning probe microscope1
    micro-machining1
    NanoSensors1
    AFM Tips1
    NanoDevice1
    Characterizers1
    NanoApertures0
    Silicon Structures0

    www.appnano.com - 2009-02-07

  2. FIB International, Inc.

    A service and consulting institute for Focused Ion Beam (FIB) technologies, testing and failure analysis of microelectronic devices, and PCB design, FAB, and ...
    training5
    classes3
    seminar3
    conductor2
    deposition2
    FAB1
    failure analysis1
    insulator1
    FIB1
    probing1
    GAE1
    PCB board1
    Focused Ion Beam1
    micro-machining1
    AFM tips1
    micro-surgery1
    cross-sectioning1
    charge neutralization0
    Gas-Assisted Etching0
    IC debugs0
    IC design alternation0
    IC modifications0
    IC testing pads0
    precision micromilling0
    Scanning Ion Microscope0
    TEM samples0

    www.fibinternational.com - 2009-02-05

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